DTS DeviceTest.Solutions
Test your devices and process steps at the wafer level to ensure the highest quality.
Suitable for all types of processes and devices; highly recommended for MEMS due to the vacuum environment.
A special feature is the ability to set any pressure level within the range from ATM to HV with meter-grade accuracy—for example, to test or calibrate your GYRO and/or PRESSURE sensors.
Special nozzle solutions are available for gas detectors—simply contact us so we can help you select the optimal configuration for your application.
Tactile connections can be made using a single needle and a probe card—which is why we bring our experienced probe partners on board for the project.
Rely on the proven solutions of the Adenso VAC.ROBOTICS platform and be prepared for rapidly increasing customer and process requirements
What tasks do you have lined up at the moment?
Your advantages
- Footprint: space-saving thanks to direct integration in cluster systems
- Flexible: different substrate sizes and geometries are possible
- Productive: fast handling, alignment, and processing
- Precise: based on adCONTROL precise servo drives and PLC based cluster operating system
- Cost-cutting: saves investment and operating costs
- Future-proof: thanks to numerous upgrade options